Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses-Reference-Cited by-同舟云学术

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Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses

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Container-title:IEEE International Symposium on Electromagnetic Compatibility
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Author:

Camp M.,Garbe H.,Nitsch D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/8028/22167/01032453.pdf?arnumber=1032453

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental Study of the Electrical Characteristics of a Modal Filter on a Double-Sided PCB without an Upper Reference Conductor;2022 International Siberian Conference on Control and Communications (SIBCON);2022-11-17

2. Optimization of a Modal Filter Realized on a Double-Sided Printed Circuit Board;2022 International Ural Conference on Electrical Power Engineering (UralCon);2022-09-23

3. Comparing Electrical Characteristics of Coplanar Waveguides and Modal Filters;2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials (EDM);2022-06-30

4. Vulnerability Assessment Method for Electronic Devices Excited by Transient Electromagnetic Disturbances;IEEE Electromagnetic Compatibility Magazine;2022

5. Dependence of Irradiated High-Power Electromagnetic Waves on the Failure Threshold Time of Semiconductors Using a Closed Waveguide;Electronics;2021-08-06

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