Author:
Jenkins K.A.,Jose A.P.,Heidel D.F.
Cited by
24 articles.
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1. A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA;2023 21st IEEE Interregional NEWCAS Conference (NEWCAS);2023-06-26
2. Special Session: On-chip jitter BIST with sub-picosecond resolution at GHz frequencies;2023 IEEE 24th Latin American Test Symposium (LATS);2023-03-21
3. A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology;2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC);2022-10-03
4. A 10 Gb/s On-chip Jitter Measurement Circuit Based on Transition Region Scanning Method;2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID);2022-02
5. Measurement of the Large-Signal Propagation Delay of Single Transistors;RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors;2021-12-16