Author:
Hung-kai Chen ,Chih-hu Wang ,Chau-chin Su
Cited by
15 articles.
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1. An Efficient Time-Tick based BIST Scheme to Calculate Static Errors of ADC;2023 International Conference on Intelligent Technologies for Sustainable Electric and Communications Systems (iTech SECOM);2023-12-18
2. Digital Sine Oscillators Based on Higher Order Sigma–Delta Modulation;IEEE Transactions on Instrumentation and Measurement;2022
3. A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs;2018 IEEE International Symposium on Circuits and Systems (ISCAS);2018-05
4. Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique;IEEE Transactions on Circuits and Systems I: Regular Papers;2015-10
5. On Chip Signal Generators for Low Overhead ADC BIST;Journal of Electronic Testing;2012-07-29