Hotspot Detection via Attention-based Deep Layout Metric Learning-Reference-Cited by-同舟云学术

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Hotspot Detection via Attention-based Deep Layout Metric Learning

Published:2021 Issue: Volume: Page:1-1
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Geng Hao,Yang Haoyu,Zhang Lu,Miao Jin,Yang Fan,Zeng Xuan,Yu Bei

Funder

National Key R and D Program of China

Research Grants Council University Grants Committee

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6917053/09536958.pdf?arnumber=9536958

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Feature Fusion based Hotspot Detection with R-EfficientNet;Proceedings of the Great Lakes Symposium on VLSI 2024;2024-06-12

2. Machine Learning in Advanced IC Design: A Methodological Survey;IEEE Design & Test;2023-02

3. Hotspot Prediction: SEM Image Generation With Potential Lithography Hotspots;IEEE Transactions on Semiconductor Manufacturing;2023

4. Techniques for CAD Tool Parameter Auto-tuning in Physical Synthesis: A Survey (Invited Paper);2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC);2022-01-17

5. Machine Learning for Mask Synthesis and Verification;Machine Learning Applications in Electronic Design Automation;2022

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