Correlated Bayesian Model Fusion: Efficient High-Dimensional Performance Modeling of Analog/RF Integrated Circuits Over Multiple Corners-Reference-Cited by-同舟云学术

Correlated Bayesian Model Fusion: Efficient High-Dimensional Performance Modeling of Analog/RF Integrated Circuits Over Multiple Corners

Published:2023-02 Issue:2 Volume:42 Page:360-370
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Gao Zhengqi¹^ORCID,Wang Fa²^ORCID,Tao Jun¹^ORCID,Su Yangfeng³,Zeng Xuan¹^ORCID,Li Xin⁴

Affiliation:

1. State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China

2. Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA

3. School of Mathematical Sciences, Fudan University, Shanghai, China

4. Data Science Research Center, Duke Kunshan University, Kunshan, Jiangsu, China

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China (NSFC) Research

Laboratory of Mathematics for Nonlinear Science at Fudan University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/10021949/09777680.pdf?arnumber=9777680

Reference27 articles.

1. Template-Free Symbolic Performance Modeling of Analog Circuits via Canonical-Form Functions and Genetic Programming

2. Low-noise amplifier comparison at 2 GHz in 0.25-$\mathrm{\mu}\text{m}$ and 0.18-$\mathrm{\mu}\text{m}$ RF-CMOS and SiGe BiCMOS;floyd;Dig Papers IEEE Radio Freq Integr Circuits,2004

3. From Process Corners to Statistical Circuit Design Methodology: Opportunities and Challenges

4. Finding Deterministic Solution From Underdetermined Equation: Large-Scale Performance Variability Modeling of Analog/RF Circuits

5. High-dimensional statistical modeling and analysis of custom integrated circuits (invited paper)

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