Functional Criticality Analysis of Structural Faults in AI Accelerators
Author:
Affiliation:
1. Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA
2. Design Engineering Group, Intel Corporation, Folsom, CA, USA
Funder
Semiconductor Research Corporation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Link
http://xplorestaging.ieee.org/ielx7/43/9956950/09751719.pdf?arnumber=9751719
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