A Space–Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing-Reference-Cited by-同舟云学术

A Space–Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing

Published:2022-12 Issue:12 Volume:41 Page:5501-5514
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Hou Tianshu¹^ORCID,Wong Ngai²^ORCID,Chen Quan³^ORCID,Ji Zhigang¹^ORCID,Chen Hai-Bao¹^ORCID

Affiliation:

1. Department of Micro/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China

2. Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong

3. School of Microelectronics, Southern University of Science and Technology, Shenzhen, China

Funder

National Key Research and Development Program of China

Nature Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

Reference46 articles.

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