Funder
National Natural Science Foundation of China
Beijing National Research Center for Information Science and Technology
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
9 articles.
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1. Fast Estimation for Electromigration Nucleation Time Based on Random Activation Energy Model;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
2. Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-12
3. Frequency-Domain Transient Electromigration Analysis Using Circuit Theory;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28
4. Electromigration Stress Analysis with Rational Krylov-based Approximation of Matrix Exponential;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03
5. Recent Progress in the Analysis of Electromigration and Stress Migration in Large Multisegment Interconnects;Proceedings of the 2023 International Symposium on Physical Design;2023-03-26