Impact of Series Resistance on Bulk CMOS Current Matching Over the 5–300K Temperature Range-Reference-Cited by-同舟云学术

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Impact of Series Resistance on Bulk CMOS Current Matching Over the 5–300K Temperature Range

Published:2017-07 Issue:7 Volume:38 Page:847-850
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Dao Nguyen Cong^ORCID,El Kass Abdallah,Jin Craig T.,Leong Philip H. W.

Funder

University of Sydney, Australian Institute for Nanoscale Science and Technology Accelerator Scheme

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/7956370/07935354.pdf?arnumber=7935354

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Transistor Matrix Array for Measuring Variability and Random Telegraph Noise at Cryogenic Temperatures;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15

2. Parameter extraction in a 65nm nMOSFET technology from 300 K down to 3.8 K;2022 IEEE Latin American Electron Devices Conference (LAEDC);2022-07-04

3. Effect of Random Potential Fluctuations on Threshold Voltage Variability in Bulk MOSFETs at Cryogenic Temperature;2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2022-03-06

4. Effect of percolation path on temperature dependence of threshold voltage variability in bulk MOSFETs;Japanese Journal of Applied Physics;2022-02-08

5. Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures;IEEE Journal of the Electron Devices Society;2020

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