Author:
Tulala Peter,Mahyar Hamidreza,Ghalebi Elahe,Grosu Radu
Cited by
18 articles.
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1. Intelligent Electrical Assessment of Silicon and Silicon Carbide Wafers for Power Applications in Automotive Field;2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive);2024-06-26
2. Soft kind of Computing Based Least Resource Data finding which is Used for Analysis purpose;2024 4th International Conference on Advance Computing and Innovative Technologies in Engineering (ICACITE);2024-05-14
3. Semi-supervised rotation-invariant representation learning for wafer map pattern analysis;Engineering Applications of Artificial Intelligence;2023-04
4. Deep Learning for Automatic Wafer Monitoring System;2023 Smart Systems Integration Conference and Exhibition (SSI);2023-03-28
5. DeepWafer: A Generative Wafermap Model with Deep Adversarial Networks;2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA);2022-12