Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
42 articles.
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1. Accumulator-based generation for serial TPG;Proceedings of the 19th Panhellenic Conference on Informatics;2015-10
2. Aliasing Reduction in Accumulator-Based Response Verification;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2014-11
3. Input Vector Monitoring Concurrent BIST Architecture Using SRAM Cells;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2014-07
4. An effective two-pattern test generator for Arithmetic BIST;Computers & Electrical Engineering;2013-02
5. A Low-Overhead BIST Architecture for Digital Data Processing Circuits;Lecture Notes in Electrical Engineering;2012-08-14