Author:
Dibaj Roya,Al-Khalili Dhamin,Shams Maitham
Cited by
2 articles.
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1. B-open Defect: A Novel Defect Model in FinFET Technology;ACM Journal on Emerging Technologies in Computing Systems;2022-12-09
2. Gate Oxide Short Defect Model in FinFETs;Journal of Electronic Testing;2018-04-14