Automated Void Detection in TSVs from 2D X-Ray Scans using Supervised Learning with 3D X-Ray Scans-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Automated Void Detection in TSVs from 2D X-Ray Scans using Supervised Learning with 3D X-Ray Scans

Published:2021-06 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
language:
Short-container-title:

Author:

Pahwa Ramanpreet Singh,Gopalakrishnan Saisubramaniam,Su Huang,Ping Ong Ee,Dai Haiwen,Wee David Ho Soon,Qin Ren,Rao Vempati Srinivasa

Funder

Economic Development Board (EDB), Singapore

Agency for Science, Technology and Research (A*STAR)

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9501397/9501403/09501624.pdf?arnumber=9501624

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. AI-based 3D Metrology and Defect Detection of HBMs in XRM Scans;World Scientific Annual Review of Artificial Intelligence;2024-01

2. 3D Defect Detection and Metrology of HBMs using Semi-Supervised Deep Learning;2023 IEEE 73rd Electronic Components and Technology Conference (ECTC);2023-05

3. Nondestructive monitoring of annealing and chemical–mechanical planarization behavior using ellipsometry and deep learning;Microsystems & Nanoengineering;2023-04-28

4. On the Use of Component Structural Characteristics for Voxel Segmentation in Semicon 3D Images;ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP);2022-05-23

5. X‐ray microscopy and automatic detection of defects in through silicon vias in three‐dimensional integrated circuits;Engineering Reports;2022-05-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP