Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
22 articles.
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1. Diagnosing Double Faulty Chains through Failing Bit Separation;2022 IEEE International Test Conference (ITC);2022-09
2. Partially-Specified Output Response for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
3. Scan Chain Architecture with Data Duplication for Multiple Scan Cell Fault Diagnosis;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
4. Logic Diagnosis with Hybrid Fail Data;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
5. High Throughput Multiple Device Chain Diagnosis Methodology for Clock and Control Line Defects;2021 IEEE Microelectronics Design & Test Symposium (MDTS);2021-05-18