Fast Wafer-Level Characterization of Silicon Photodetectors by Photoluminescence Imaging
Author:
Affiliation:
1. Department of Electronics and Nanoengineering, Aalto University, Espoo, Finland
2. ElFys Oy, Espoo, Finland
Funder
Academy of Finland
EMPIR program co-financed by the Participating States and from the European Union’s Horizon 2020 Research and Innovation Program
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/9761777/09743485.pdf?arnumber=9743485
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