Physical Transient Model of IGBT in Forward Conduction Mode
Author:
Affiliation:
1. State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China
2. Hefei University of Technology, Hefei, China
3. State Grid Corporation of China, Beijing, China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/9802454/09786008.pdf?arnumber=9786008
Reference33 articles.
1. An Improved Fourier-Series-Based IGBT Model by Mitigating the Effect of Gibbs Phenomenon at Turn on
2. A Datasheet Driven Unified Si/SiC Compact IGBT Model for N-Channel and P-Channel Devices
3. Modeling Inductive Switching Characteristics of High-Speed Buffer Layer IGBT
4. An analytical model for the steady-state and transient characteristics of the power insulated-gate bipolar transistor
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2. An Analytical Temperature-Dependent Turn-Off Model for High-Voltage Field-Stop IGBTs Considering the Influence of Drive Circuit;IEEE Transactions on Power Electronics;2024-08
3. Improved HVIGBT Transient Modeling Method Based on Hefner Model;2023 2nd Asia Power and Electrical Technology Conference (APET);2023-12-28
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