Single- Versus Multi-Step Trap Assisted Tunneling Currents—Part I: Theory-Reference-Cited by-同舟云学术

Single- Versus Multi-Step Trap Assisted Tunneling Currents—Part I: Theory

Published:2022-08 Issue:8 Volume:69 Page:4479-4485
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Schleich Christian¹^ORCID,Waldhor Dominic²^ORCID,Knobloch Theresia²^ORCID,Zhou Weifeng²,Stampfer Bernhard¹^ORCID,Michl Jakob²^ORCID,Waltl Michael¹^ORCID,Grasser Tibor²^ORCID

Affiliation:

1. Christian Doppler Laboratory for Single-Defect Spectroscopy, Institute for Microelectronics, TU Wien, Vienna, Austria

2. Tibor Grasser are with the Institute for Microelectronics, TU Wien, Vienna, Austria

Funder

Austrian Federal Ministry for Digital and Economic Affairs

Österreichische Nationalstiftung für Forschung, Technologie und Entwicklung

Christian Doppler Forschungsgesellschaft

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/9839401/09829547.pdf?arnumber=9829547

Reference42 articles.

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