String Current Compensation Method in VNAND Flash for Hardware-Based BNNs

Author:

Back Jong-Won1ORCID,Yoo Ho-Nam1ORCID,Kim Jaehyeon1,Park Min-Kyu1ORCID,Choi Woo Young1ORCID,Lee Jong-Ho1ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory

2. A 3D NAND Flash Ready 8-Bit Convolutional Neural Network Core Demonstrated in a Standard Logic Process

3. Binarized neural networks;hubara;Proc Adv Neural Inf Process Syst,2016

4. Characterization and analysis of bit errors in 3D TLC NAND flash memory: Semantic scholar;papandreou;Proc IEEE Int Rel Phys Symp (IRPS),2019

5. Fully hardware-implemented memristor convolutional neural network;yao;Nature,2020

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