Author:
Czarnecki P.,Rottenberg X.,Puers R.,de Wolf I.
Cited by
2 articles.
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1. Reliability of RF MEMS;Handbook of Mems for Wireless and Mobile Applications;2013
2. The Impact of Dielectric Material and Temperature on Dielectric Charging in RF MEMS Capacitive Switches;NATO Science for Peace and Security Series B: Physics and Biophysics;2010