Author:
Beall James R.,Hamiter Leon
Cited by
9 articles.
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1. Consideration of a Ga-FIB in Lamella Sample Prep for EBIC Analysis of Advanced-node SRAMs;2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC);2024-05-13
2. One-Probe Nanoprobing of Power Devices and Electronic Packages;2023 24th European Microelectronics and Packaging Conference & Exhibition (EMPC);2023-09-11
3. Enhanced EBAC localization of gate oxide defects after high voltage electron beam irradiation;Microelectronics Reliability;2023-08
4. In-situ EBIC measurements of IGBT during device turn-on;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24
5. In-situ measurement of depletion zones in power devices;2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC);2023-05-01