1. JCH Phang, DSH Chan, M Palaniappan, JM Chin, B Davis, M Bruce, et al., "A Review of Laser Induced Techniques for Microelectronic Failure Analysis", IEEE International Symposium on the Physical and Failure Analysis (IPFA), 2004, pp. 255–261.
2. JCH Phang, DSH Chan, SL Tan, WB Len, KH Yim, LS Koh, et al., "A Review of Near Infrared Photon Emission Microscopy and Spectroscopy", IEEE International Symposium on the Physical and Failure Analysis (IPFA), 2005, pp. 275–281.
3. Fault site localization technique by imaging with nanoprobes;Nokuo;Electronic Device Failure Analysis.,2009
4. EBIC - a valuable tool for semiconductor evaluation and failure analysis;Beall;Reliability Physics Symposium,1977
5. Passive voltage contrast technique for rapid in-line characterization and failure isolation during development of deep-Submiscron ASIC CMOS technology;Liang;ISTFA,1998