Influence of Lamination Press on Resistance Degradation of X5R Ultra-thin MLCCs-Reference-Cited by-同舟云学术

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Influence of Lamination Press on Resistance Degradation of X5R Ultra-thin MLCCs

Published:2022-08-10 Issue: Volume: Page:
ISSN:
Container-title:2022 23rd International Conference on Electronic Packaging Technology (ICEPT)
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Author:

Bi Daoguang¹,Zhang Lei¹,Huang Xiong¹,Yu Shuhui¹,Sun Rong¹,Fu Zhenxiao²,Cao Xiuhua²

Affiliation:

1. Chinese Academy of Sciences,Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology,Shenzhen,China

2. Guangdong Fenghua Advanced Technology Holding Co., Ltd,State Key Laboratory of Advanced Materials and Electronic Components,Zhaoqing,China

Funder

National Science Foundation

Natural Science Foundation of Guangdong Province

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9872527/9872536/09873249.pdf?arnumber=9873249

Reference10 articles.

1. Microstructural design of BaTiO3-based ceramics for temperature-stable multilayer ceramic capacitors

2. Grain size effect on electrical and reliability characteristics of modified fine-grained BaTiO3 ceramics for MLCCs

3. Stable Temperature Dielectrics of (Ba,Ca)(Ti,Zr)O3-Based MLCCs with Non-Core-Shell Structure by Novel Sintering Approach

4. Kinetics of Oxygen Diffusion into Multilayer Ceramic Capacitors During the Re-oxidation Process and its Implications on Dielectric Properties

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Contribution of sintering process to the reliability of X7R BME-MLCCs with high-voltage;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08

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