Small Photoresist Defect Samples Augmentation Based on Generative Adversarial Network-Reference-Cited by-同舟云学术

Small Photoresist Defect Samples Augmentation Based on Generative Adversarial Network

Published:2023-02-24 Issue: Volume: Page:
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Container-title:2023 IEEE 6th Information Technology,Networking,Electronic and Automation Control Conference (ITNEC)
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Author:

Yang Guang¹,Li Zhihang¹,Yang Zhijia¹,Cui Shuping²

Affiliation:

1. Chinese Academy of Sciences,State Key Laboratory of Robotics, Shenyang Institute of Automation,Shenyang,China,110016

2. Chinese Academy of Sciences,Institutes for Robotics and Intelligent Manufacturing,Shenyang,China,110169

Funder

Technology Development

Publisher

IEEE

Link

Reference14 articles.

1. Large scale gan training for high fidelity natural image synthesis;brock,2018

4. mixup: Beyond empirical risk minimization;zhang,2017

5. Yolov4: Optimal speed and accuracy of object detection;bochkovskiy,2020

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