Semiconductor Manufacturing Data Synthesis through GANs-Reference-Cited by-同舟云学术

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Semiconductor Manufacturing Data Synthesis through GANs

Published:2024-05-13 Issue: Volume:arxiv.org/abs/1701.04862 Page:1-6
ISSN:
Container-title:2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
language:
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Author:

Tse Brian¹,Wright Tori¹,Nsiye Emmanuel²,Azinord Timothy¹,Medina David¹,Mondesire Sean³

Affiliation:

1. College of Engineering and Computer Science, University of Central Florida,Orlando,FL,USA

2. Institute for Simulation and Training, University of Central Florida,Orlando,FL,USA

3. School of Modeling, Simulation, & Training, University of Central Florida,Orlando,FL,USA

Funder

U.S. Economic Development Administration

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10545359/10545360/10545371.pdf?arnumber=10545371

Reference26 articles.

1. A CNN-Based Novel Approach for Classification of Sacral Hiatus with GAN-Powered Tabular Data Set

2. Generative Adversarial Networks for Synthetic Defect Generation in Assembly and Test Manufacturing

3. Small Photoresist Defect Samples Augmentation Based on Generative Adversarial Network

4. Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data

5. Conditional image synthesis with auxiliary classifier gans;Odena,2017

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Probabilistic Modeling and Machine Learning for Preventative Maintenance Prediction in Semiconductor Manufacturing;2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC);2024-05-13

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