Fermi Pinning-Induced Thermal Instability of Metal-Gate Work Functions-Reference-Cited by-同舟云学术

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Fermi Pinning-Induced Thermal Instability of Metal-Gate Work Functions

Published:2004-05 Issue:5 Volume:25 Page:337-339
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:en
Short-container-title:IEEE Electron Device Lett.

Author:

Yu H.Y.,Ren C.,Yeo Y.-C.,Kang J.F.,Wang X.P.,Ma H.H.H.,Li M.-F.,Chan D.S.H.,Kwong D.-L.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/28808/01295126.pdf?arnumber=1295126

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