An Ab Initio, Fully Coherent, Semi-Analytical Model of Surface-Roughness-Induced Scattering
Author:
Affiliation:
1. Institute of Electrical Measurement and Sensor Systems, Graz University of Technology, Graz, Austria
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/50/10058093/09964031.pdf?arnumber=9964031
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5. Effect of size and roughness on light transmission in a Si/SiO2 waveguide: Experiments and model
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