Impact Ionization Coefficients of Digital Alloy and Random Alloy Al0.85Ga0.15As0.56Sb0.44 in a Wide Electric Field Range-Reference-Cited by-同舟云学术

Impact Ionization Coefficients of Digital Alloy and Random Alloy Al_0.85Ga_0.15As_0.56Sb_0.44 in a Wide Electric Field Range

Published:2022-07-15 Issue:14 Volume:40 Page:4758-4764
ISSN:0733-8724
Container-title:Journal of Lightwave Technology
language:
Short-container-title:J. Lightwave Technol.

Author:

Guo Bingtian¹^ORCID,Jin Xiao²^ORCID,Lee Seunghyun³^ORCID,Ahmed Sheikh Z.¹^ORCID,Jones Andrew H.¹^ORCID,Xue Xingjun¹,Liang Baolai⁴,Lewis Harry I. J.²^ORCID,Kodati Sri H.³,Chen Dekang¹,Ronningen Theodore J.³^ORCID,Grein Christoph H.⁵,Ghosh Avik W.¹^ORCID,Krishna Sanjay³^ORCID,David John P. R.²^ORCID,Campbell Joe C.¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA

2. Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, U.K.

3. Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA

4. California NanoSystems Institute, University of California, Los Angeles, CA, USA

5. Department of Physics, University of Illinois, Chicago, IL, USA

Funder

EPSRC Studentship

Directed Energy–Joint Technology Office

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx7/50/9826878/09762025.pdf?arnumber=9762025

Reference38 articles.

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3. High Gain, Low Dark Current Al0.8In0.2As0.23Sb0.77 Avalanche Photodiodes

4. AlInAsSb Impact Ionization Coefficients

5. Chapter 5 Avalanche Photodiodes

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