Detection and analysis of micro-cracks in multi-crystalline silicon wafers during solar cell production
Author:
Affiliation:
1. Fraunhofer Institute for Solar Energy Systems ISE, 79110 Freiburg, Germany
2. Fraunhofer Center for Silicon Photovoltaics CSP, 06120 Halle, Germany
3. Jonas & Redmann Photovoltaics Production Solutions GmbH, 10553 Berlin, Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6177424/6185829/06186271.pdf?arnumber=6186271
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1. Crack Catcher AI – Enabling smart fracture mechanics approaches for damage control of thin silicon cells or wafers;Solar Energy Materials and Solar Cells;2024-08
2. Detection of Microcracks in Cz‐Si Wafer Manufacturing by Photoluminescence Imaging;physica status solidi (a);2024-07
3. Improved Yolov5 Algorithm for Surface Defect Detection of Solar Cell;2023 35th Chinese Control and Decision Conference (CCDC);2023-05-20
4. Design of EL defect detection system for photovoltaic power station modules;Journal of Physics: Conference Series;2022-10-01
5. Nondestructive Photoelastic and Machine Learning Characterization of Surface Cracks and Prediction of Weibull Parameters for Photovoltaic Silicon Wafers;Journal of Engineering Materials and Technology;2022-01-12
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