Evolution of oxide disruptions: The (W)hole story about poly-Si/c-Si passivating contacts-Reference-Cited by-同舟云学术

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Evolution of oxide disruptions: The (W)hole story about poly-Si/c-Si passivating contacts

Published:2016-06 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
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Author:

Tetzlaff Dominic,Krugener Jan,Larionova Yevgeniya,Reiter Sina,Turcu Mircea,Peibst Robby,Hohne Uwe,Kahler Jan-Dirk,Wietler Tobias

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7701171/7749395/07749582.pdf?arnumber=7749582

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pinhole Formation by Nucleation-Driven Phase Separation in TOPCon and POLO Solar Cells: Structural Dynamics and Optimization;ACS Applied Energy Materials;2024-04-11

2. Design Rule of Electron- and Hole-Selective Contacts for Polycrystalline Silicon-Based Passivating Contact Solar Cells;ACS Applied Materials & Interfaces;2023-09-29

3. Exploring hafnium oxide's potential for passivating contacts for silicon solar cells;Solar Energy Materials and Solar Cells;2023-08

4. On-Chip Carrier-Selective Contact Photovoltaic Cell;IEEE Transactions on Electron Devices;2023-04

5. Tunnel Oxide Deposition Techniques and Their Parametric Influence on Nano-Scaled SiOx Layer of TOPCon Solar Cell: A Review;Energies;2022-08-08

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