AMS Test Vector Generation using AMS Verification and IEEE P1687.2

Author:

Zivkovic Vladimir A.1,Palazzi Michele2,Chuen Alvan Lam Ming2,Isager Mogens1

Affiliation:

1. Infineon Technologies,Denmark

2. Infineon Technologies,USA

Publisher

IEEE

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Design and Verification of a SAR ADC SystemVerilog Real Number Model;Journal of Electronic Testing;2024-06

2. A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement;2024 IEEE European Test Symposium (ETS);2024-05-20

3. A Method for Simulating Mixed-Signal ATE Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

4. Machine Learning based Waveform Predictions using Discrete Wavelet Transform for Automated Verification of Analog and Mixed Signal Integrated Circuits;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06

5. Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits;2023 IEEE International Test Conference (ITC);2023-10-07

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