Test, Reliability and Functional Safety Trends for Automotive System-on-Chip-Reference-Cited by-同舟云学术

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

Published:2022-05-23 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE European Test Symposium (ETS)
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Author:

Angione F.¹,Appello D.²,Aribido J.³,Athavale J.³,Bellarmino N.¹,Bernardi P.¹,Cantoro R.¹,De Sio C.¹,Foscale T.¹,Gavarini G.¹,Guerrero J.¹,Huch M.⁴,Iaria G.¹,Kilian T.⁴,Mariani R.³,Martone R.¹,Ruospo A.¹,Sanchez E.¹,Schlichtmann U.⁴,Squillero G.¹,Reorda M. Sonza¹,Sterpone L.¹,Tancorre V.²,Ugioli R.²

Affiliation:

1. Politecnico di Torino, IT

2. STMicroelectronics, IT

3. NVIDIA, US

4. Infineon Technologies, DE

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9810327/9810358/09810388.pdf?arnumber=9810388

Reference12 articles.

1. A Reliability Analysis of a Deep Neural Network

2. Statistical fault injection: Quantified error and confidence

3. An experiment of burn-in time reduction based on parametric test analysis

4. Exploiting Active Learning for Microcontroller Performance Prediction

5. Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Multilabel Active Learning Framework for Microcontroller Performance Screening;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-10

2. Evaluation and Mitigation of Faults Affecting Swin Transformers;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03

3. SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks;2023 IEEE European Test Symposium (ETS);2023-05-22

4. Special Session: Approximation and Fault Resiliency of DNN Accelerators;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

5. A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips;IEEE Access;2023