Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip-Reference-Cited by-同舟云学术

Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip

Published:2022-05-23 Issue: Volume: Page:
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Container-title:2022 IEEE European Test Symposium (ETS)
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Author:

Bernardi P.¹,Insinga G.¹,Paganini G.¹,Cantoro R.¹,Beer P.²,Coppetta M.²,Mautone N.²,Carnevale G.²,Scaramuzza P.²,Ullmann R.²

Affiliation:

1. Politecnico di Torino,Dipartimento di Automatica e Informatica,Italy

2. INFINEON Technologies,Germany and Italy

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9810327/9810358/09810445.pdf?arnumber=9810445

Reference11 articles.

1. Controller Architecture for Memory BIST Algorithms;abhas;IEEE International Students’ Conference on Electrical Electronics and Computer Science (SCEECS),2020

2. Cumulative embedded memory failure bitmap display & analysis;bernardi;IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems,2010

3. Processor-programmable memory BIST for bus-connected embedded memories

4. An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores

5. A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip;bernardi;European Test Symposium,2019

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