Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
10 articles.
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1. Analysis of Error Masking and Restoring Properties of Sequential Circuits;IEEE Transactions on Computers;2013-09
2. Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2009-01
3. On Reducing Circuit Malfunctions Caused by Soft Errors;2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems;2008-10
4. Invariant States and Redundant Logic in Synchronous Sequential Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2007-06
5. On masking of redundant faults in synchronous sequential circuits with design-for-testability logic;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2005-02