Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions
-
Published:2009-01
Issue:1
Volume:28
Page:121-129
-
ISSN:0278-0070
-
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
-
language:
-
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
Author:
Pomeranz Irith,Reddy Sudhakar M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Models for Delay Faults;Models in Hardware Testing;2009-10-27