Mutation Testing Cost Reduction Techniques: A Survey
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Software
Link
http://xplorestaging.ieee.org/ielx5/52/5452137/05452149.pdf?arnumber=5452149
Cited by 51 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Mutation Testing in Practice: Insights From Open-Source Software Developers;IEEE Transactions on Software Engineering;2024-05
2. Leveraging Genetic Algorithms for Efficient Search-Based Higher Order Mutation Testing;Computing and Informatics;2024
3. Mutation testing optimisations using the Clang front‐end;Software Testing, Verification and Reliability;2023-10-17
4. Guiding Greybox Fuzzing with Mutation Testing;Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis;2023-07-12
5. Parallel mutation testing for large scale systems;Cluster Computing;2023-06-20
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