Performance of a new Schottky CdTe detector for hard X-ray spectroscopy-Reference-Cited by-同舟云学术

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Performance of a new Schottky CdTe detector for hard X-ray spectroscopy

Published:1998-06 Issue:3 Volume:45 Page:428-432
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Matsumoto C.,Takahashi T.,Takizawa K.,Ohno R.,Ozaki T.,Mori K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx4/23/15001/00682421.pdf?arnumber=682421

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2. Effect of Electron Irradiation on Spectroscopic Properties of Schottky Barrier CdTe Semiconductor Detectors;High-Z Materials for X-ray Detection;2023

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4. Polarization effect of Schottky-barrier CdTe semiconductor detectors after electron irradiation;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2022-03

5. In and Al Schottky Contacts Comparison on P-Type Chlorine-Doped CdTe;Sensors;2021-04-15

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