Development of a Low CTE chip scale package
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6573226/6575533/06575688.pdf?arnumber=6575688
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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4. Characterization of Copper Diffusion in Through Silicon Vias;Materials for Advanced Packaging;2016-11-19
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