Author:
Huard V.,Angot D.,Cacho F.
Cited by
2 articles.
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1. Device Reliability to Circuit Qualification: Insights and Challenges;2022 IEEE International Integrated Reliability Workshop (IIRW);2022-10-09
2. Variability-Aware Approximate Circuit Synthesis via Genetic Optimization;IEEE Transactions on Circuits and Systems I: Regular Papers;2022-10