Author:
Schlunder Christian,Aresu Stefano,Georgakos Georg,Kanert Werner,Reisinger Hans,Hofmann Karl,Gustin Wolfgang
Cited by
9 articles.
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1. Prompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications;2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2024-06-02
2. SUIT: Secure Undervolting with Instruction Traps;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27
3. Investigation of the Off-State Degradation in Advanced FinFET Technology—Part II: Compact Aging Model and Impact on Circuits;IEEE Transactions on Electron Devices;2023-03
4. Research and Analysis on Performance Improvement of Transmission Delay Caused by BTI Aging;The 5th International Conference on Computer Science and Application Engineering;2021-10-19
5. Analysis of BTI Induced Input Buffer Aging Based on 32nm CMOS Process;2021 13th International Conference on Communication Software and Networks (ICCSN);2021-06-04