Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing-Reference-Cited by-同舟云学术

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Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing

Published:2011-04 Issue: Volume: Page:
ISSN:
Container-title:2011 International Reliability Physics Symposium
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Author:

Wilkinson Jeffrey D.,Clark Brett M.,Wong Richard,Slayman Charles,Carroll Barry,Gordon Michael,He Yi,Lauzeral Olivier,Lepla Keith,Marckmann Jennifer,McNally Brendan,Roche Philippe,Tucker Mike,Wu Tommy

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5776767/5784429/05784521.pdf?arnumber=5784521

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Specific Packaging Reliability Testing;Springer Series in Reliability Engineering;2023

2. Memory reliability of spintronic materials and devices for disaster-resilient computing against radiation-induced bit flips on the ground;Japanese Journal of Applied Physics;2017-06-30

3. Measurements of radioactive contaminants in semiconductor materials;Semiconductor Science and Technology;2016-11-10

4. Sources of variability in alpha emissivity measurements at LA and ULA levels, a multicenter study;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2014-06

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