Author:
Okada Kenji,Ito Yutaka,Suzuki Shigeru
Cited by
2 articles.
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1. Synaptic MIS Silicon Nitride Resistance Switching Memory Cells on SOI Substrate;2023 IEEE 23rd International Conference on Nanotechnology (NANO);2023-07-02
2. Effect of Frequency on Reliability Of High-K MIM Capacitors;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03