Author:
Akbal M.,Ribes G.,Vallier L.
Cited by
2 articles.
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1. New Design Optimized and IC Area Efficient Rules for the Prevention of Plasma Processing Induced Damage on CMOS Circuit Reliability;2022 IEEE International Integrated Reliability Workshop (IIRW);2022-10-09
2. Generation and Elimination of Antenna Effect;2021 2nd International Conference on Artificial Intelligence and Computer Engineering (ICAICE);2021-11