A study on the short- and long-term effects of X-ray exposure on NAND Flash memories-Reference-Cited by-同舟云学术

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A study on the short- and long-term effects of X-ray exposure on NAND Flash memories

Published:2011-04 Issue: Volume: Page:
ISSN:
Container-title:2011 International Reliability Physics Symposium
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Author:

Gerardin S.,Bagatin M.,Paccagnella A.,Visconti A.,Beltrami S.,Bertuccio M.,Czeppel L.T.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5776767/5784429/05784572.pdf?arnumber=5784572

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Assessing Electronics with Advanced 3D X-ray Imaging Techniques, Nanoscale Tomography, and Deep Learning;Journal of Failure Analysis and Prevention;2024-08-09

2. Robotic-OCT guided inspection and microsurgery of monolithic storage devices;Nature Communications;2023-09-14

3. X-ray Radiation Effects Assessment on NVMs manufactured in ST 90 nm BCD Technology;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03

4. New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards;IEEE Access;2022

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