Evaluation of parasitic bipolar effects on neutron-induced SET rates for logic gates
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6235191/6241755/06241930.pdf?arnumber=6241930
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4. Radiation hardness evaluations of 65 nm fully depleted silicon on insulator and bulk processes by measuring single event transient pulse widths and single event upset rates;Japanese Journal of Applied Physics;2015-03-19
5. Prediction, Detection and Classification Techniques of Faults, Errors and Failures;Terrestrial Radiation Effects in ULSI Devices and Electronic Systems;2014-11-28
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