Innovative Methodology for an Advanced Characterization of Perovskite Systems to Reach Buried Interfaces: In-Depth Profile by Coupling GD-OES and XPS
Author:
Affiliation:
1. Institut Photovoltaïque d'Île de France (IPVF),Palaiseau,France,91120
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10359507/10359504/10360028.pdf?arnumber=10360028
Reference6 articles.
1. Halide Perovskites: Is It All about the Interfaces?
2. GD-OES and XPS coupling: A new way for the chemical profiling of photovoltaic absorbers
3. Evaluation of the chemical and optical perturbations induced by Ar plasma on InP surface
4. In-Depth Chemical and Optoelectronic Analysis of Triple-Cation Perovskite Thin Films by Combining XPS Profiling and PL Imaging
5. Photoemission Spectroscopy Characterization of Halide Perovskites
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