Ping-pong test: Compact test vector generation for reversible circuits-Reference-Cited by-同舟云学术

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Ping-pong test: Compact test vector generation for reversible circuits

Published:2012-04 Issue: Volume: Page:
ISSN:
Container-title:2012 IEEE 30th VLSI Test Symposium (VTS)
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Author:

Zamani Masoud,Tahoori Mehdi B.,Chakrabarty Krishnendu

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6222548/6231057/06231097.pdf?arnumber=6231097

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Fault Detection Method for Missing Gate Faults in Reversible Circuits Using Binary to Gray Code Conversion;TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON);2023-10-31

2. Automatic generation of test circuits for the verification of Quantum deterministic algorithms;Proceedings of the 1st International Workshop on Quantum Programming for Software Engineering;2022-11-07

3. An Online Testing Technique for the Detection of Control Nodes Displacement Faults (CNDF) in Reversible Circuits;Communications in Computer and Information Science;2022

4. Quantum software testing: State of the art;Journal of Software: Evolution and Process;2021-12-24

5. An Approach for Detection and Localization of Missing Gate Faults in Reversible Circuit;IETE Journal of Research;2020-06-08

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