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An Approach for Detection and Localization of Missing Gate Faults in Reversible Circuit

  • Published:2020-06-08 Issue: Volume: Page:1-21
  • ISSN:0377-2063
  • Container-title:IETE Journal of Research
  • language:en
  • Short-container-title:IETE Journal of Research

Author:

Mondal Bappaditya1,Bandyopadhyay Chandan1,Bhattacharjee Anirban1,Roy Debashri2,Parekh Shalini3,Rahaman Hafizur1

Affiliation:

1. Information Technology Department, Indian Institute of Engineering Science and Technology, Shibpur, India

2. Department of Computer Science, University of Central Florida, Orlando, FL, USA

3. Department of Engineering and Architecture, ID-Lab, University of Ghent, St. Pietersnieuwstraat, Belgium

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Computer Science Applications,Theoretical Computer Science

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network;Journal of Electronic Testing;2023-08

2. Fault Localization Scheme for Missing Gate Faults in Reversible Circuits;ACM Transactions on Design Automation of Electronic Systems;2022-03-08

3. DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits;Journal of Circuits, Systems and Computers;2021-12-13

4. A Fault Diagnosis Technique of SMGFs in $k$-CNOT Based Reversible Circuits;TENCON 2021 - 2021 IEEE Region 10 Conference (TENCON);2021-12-07
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