Fault Localization Scheme for Missing Gate Faults in Reversible Circuits

Abstract

This article introduces a fault localization method to extract the exact location of single and multiple missing gate faults in reversible \( k \) -CNOT -based circuits. The primary target of the proposed method is to obtain the complete test set for localizing faults in \( k \) -CNOT circuits. We propose a fault localization algorithm to construct a fault localization tree that can be used to find equivalent and non-equivalent faults. For the non-equivalent faults, the test sequences can be obtained from the fault localization tree that uniquely localizes the non-equivalent faults. Finally, this article presents the experimental results and comparative analysis with existing works.