Design, Reliability Investigation and Analysis of 60 GHz band LNA in 65nm CMOS for 5G Mobile Communication-Reference-Cited by-同舟云学术

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Design, Reliability Investigation and Analysis of 60 GHz band LNA in 65nm CMOS for 5G Mobile Communication

Published:2018-10 Issue: Volume: Page:
ISSN:
Container-title:2018 International Conference on Applied Electromagnetics, Signal Processing and Communication (AESPC)
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Author:

Ramuswaminaath J,Swaminathan Mageshwaran,Bhattacharyya Kalyan

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9022858/9033144/09033294.pdf?arnumber=9033294

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of a 130nm CMOS Low Noise Amplifier's Performance Across Corner Conditions for WLAN Applications;2024 IEEE 14th Symposium on Computer Applications & Industrial Electronics (ISCAIE);2024-05-24

2. Design A 65nm CMOS Wideband Low Noise Amplifier;2021 IEEE 4th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE);2021-11-19

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