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3. Time-Dependent Degradation in Device Characteristics and Countermeasures by Design;VLSI Design and Test for Systems Dependability;2018-07-21
4. Variations in Device Characteristics;VLSI Design and Test for Systems Dependability;2018-07-21
5. Accurate Nanopower Supply-Insensitive CMOS Unit Vth Extractor and αVth Extractor with Continuous Variety;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2017